This course provides an intensive introduction to the techniques of X-ray Photoelectron Spectroscopy (XPS or ESCA) and Auger Electron Spectroscopy (AES), together with Scanning Auger Microscopy (SAM) and Secondary Ion Mass Spectrometry (SIMS). The course comprises lectures, laboratory demonstrations and classes with course tutors. Participants with specific problems concerning the application of electron spectroscopy are given ample opportunity to consult the lecturers. Although the main thrust of the course is developing expertise in XPS, AES and SIMS, a brief introduction to ion beam analysis is also included.
